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Journal Article 2019

A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight

Autor: Aregbesola, E. Ortega-Beltran, A. Falade, T. Jonathan, G. Hearne, S. Bandyopadhyay, R.

Southern corn leaf blight (SCLB), caused by the fungus Bipolaris maydis, is a disease that significantly affects maize productivity across the globe. A detached leaf assay (DLA) was developed to rapidly assess maize resistance to SCLB. Several experiments were conducted to: (i) identify a highly ...

Enlace original: https://cgspace.cgiar.org/handle/10568/106319

Investigación en Agricultura

DISEASE RESISTANCE

SCREENING

METHODS

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Aregbesola, E. , Ortega-Beltran, A. , Falade, T. , Jonathan, G. , Hearne, S. , Bandyopadhyay, R. , [A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight] , A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight

Journal Article 2019-07

Prospects for durable resistance against an old soybean enemy: a four-decade journey from Rpp1 (Resistance to Phakopsora pachyrhizi) to Rpp7

Autor: Chander, S. Ortega-Beltran, A. Bandyopadhyay, R. Sheoran, P. Ige, G.O. Vasconcelos, M.W. García Oliveira, A.L.

Soybean rust (SBR), caused by Phakopsora spp., is a major global concern for soybean producers. SBR causing fungi are polycyclic and obligate biotrophs, rendering the study of their biology particularly tedious. Over the past four decades, substantial progress has been made towards understanding ...

Enlace original: https://cgspace.cgiar.org/handle/10568/102423

Investigación en Agricultura

SOYBEANS

DISEASE RESISTANCE

RUSTS

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Chander, S. , Ortega-Beltran, A. , Bandyopadhyay, R. , Sheoran, P. , Ige, G.O. , Vasconcelos, M.W. , García Oliveira, A.L. , [Prospects for durable resistance against an old soybean enemy: a four-decade journey from Rpp1 (Resistance to Phakopsora pachyrhizi) to Rpp7] , Prospects for durable resistance against an old soybean enemy: a four-decade journey from Rpp1 (Resistance to Phakopsora pachyrhizi) to Rpp7

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A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight

Prospects for durable resistance against an old soybean enemy: a four-decade journey from Rpp1 (Resistance to Phakopsora pachyrhizi) to Rpp7

Descubre y comparte nuestro conocimiento público

Resultados de búsqueda

A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight

[U19ArtAregbesolaDetachedInthomDev.pdf]

Prospects for durable resistance against an old soybean enemy: a four-decade journey from Rpp1 (Resistance to Phakopsora pachyrhizi) to Rpp7

[U19ArtChanderProspectsInthomDev.pdf]