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Liu, BingAsseng, SentholdMüller, ChristophEwert, FrankElliott, JoshuaLobell, David B.Martre, PierreRuane, Alex C.Wallach, DanielJones, James W.Rosenzweig, CynthiaAggarwal, Pramod K.Alderman, Phillip D.Anothai, JakaratBasso, BrunoBiernath, ChristianCammarano, DavideChallinor, Andrew J.Deryng, DelphineSanctis, Giacomo deDoltra, JordiFereres, EliasFolberth, ChristianGarcía Vila, MargaritaGayler, SebastianHoogenboom, GerritHunt, Leslie A.Izaurralde, Roberto CésarJabloun, MohamedJones, Curtis D.Kersebaum, Kurt-ChristianKimball, Bruce A.Köhler, Ann-KristinKumar, Soora NareshNendel, ClaasO'Leary, Garry J.Olesen, J.E.Ottman, Michael J.Palosuo, TaruPrasad, P. V. VaraPriesack, EckartPugh, Thomas A. M.Reynolds, Matthew P.Rezaei, Ehsan EyshiRötter, Reimund P.Schmid, ErwinSemenov, Mikhail A.Shcherbak, IuriiStehfest, ElkeStöckle, Claudio O.Stratonovitch, PierreStreck, ThiloSupit, IwanTao, FuluThorburn, Peter J.Waha, KatharinaWall, Gerard W.Wang, EnliWhite, Jeffrey W.Wolf, JoostZhao, ZhiganZhu, Yan[Similar estimates of temperature impacts on global wheat yield by three independent methods]Similar estimates of temperature impacts on global wheat yield by three independent methods

Cai, YongyangSteinbuks, JevgenijsElliott, JoshuaHertel, Thomas W.[ The Effect of Climate and Technological Uncertainty in Crop Yields on the Optimal Path of global land use ]

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