Southern corn leaf blight (SCLB), caused by the fungus Bipolaris maydis, is a disease that significantly affects maize productivity across the globe. A detached leaf assay (DLA) was developed to rapidly assess maize resistance to SCLB. Several experiments were conducted to: (i) identify a highly ...
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https://cgspace.cgiar.org/handle/10568/106319
Aregbesola, E.
,
Ortega-Beltran, A.
,
Falade, T.
,
Jonathan, G.
,
Hearne, S.
,
Bandyopadhyay, R.
,
[A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight]
,
A detached leaf assay to rapidly screen for resistance of maize to Bipolaris maydis, the causal agent of southern corn leaf blight
