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Microcomputer-based simulation models are increasingly being recommended as multipurpose tools for agricultural research. Use of a model should be conditioned by an evaluation of its performance and understanding of its limitations. This paper evaluates the responses of the process-oriented growt...


White, Jeffrey W.Hoogenboom, GerritJones, James W.Boote, Kenneth J.[Evaluation of the dry bean model BEANGRO V1.01 for crop production research in a tropical environment]Evaluation of the dry bean model BEANGRO V1.01 for crop production research in a tropical environment
Hoogenboom, GerritJones, James W.White, J.W.Boote, Kenneth J.[BEANGRO version 1.0. a Phaseolus computer simulation model]BEANGRO version 1.0. a Phaseolus computer simulation model
Liu, BingAsseng, SentholdMüller, ChristophEwert, FrankElliott, JoshuaLobell, David B.Martre, PierreRuane, Alex C.Wallach, DanielJones, James W.Rosenzweig, CynthiaAggarwal, Pramod K.Alderman, Phillip D.Anothai, JakaratBasso, BrunoBiernath, ChristianCammarano, DavideChallinor, Andrew J.Deryng, DelphineSanctis, Giacomo deDoltra, JordiFereres, EliasFolberth, ChristianGarcía Vila, MargaritaGayler, SebastianHoogenboom, GerritHunt, Leslie A.Izaurralde, Roberto CésarJabloun, MohamedJones, Curtis D.Kersebaum, Kurt-ChristianKimball, Bruce A.Köhler, Ann-KristinKumar, Soora NareshNendel, ClaasO'Leary, Garry J.Olesen, J.E.Ottman, Michael J.Palosuo, TaruPrasad, P. V. VaraPriesack, EckartPugh, Thomas A. M.Reynolds, Matthew P.Rezaei, Ehsan EyshiRötter, Reimund P.Schmid, ErwinSemenov, Mikhail A.Shcherbak, IuriiStehfest, ElkeStöckle, Claudio O.Stratonovitch, PierreStreck, ThiloSupit, IwanTao, FuluThorburn, Peter J.Waha, KatharinaWall, Gerard W.Wang, EnliWhite, Jeffrey W.Wolf, JoostZhao, ZhiganZhu, Yan[Similar estimates of temperature impacts on global wheat yield by three independent methods]Similar estimates of temperature impacts on global wheat yield by three independent methods
Wallach, DanielThorburn, Peter J.Asseng, SentholdChallinor, Andrew J.Ewert, FrankJones, James W.Rotter, Reimund P.Ruane, Alex C.[Estimating model prediction error: Should you treat predictions as fixed or random?]Estimating model prediction error: Should you treat predictions as fixed or random?
Martre, PierreWallach, DanielAsseng, SentholdEwert, FrankJones, James W.Rötter, Reimund P.Boote, Kenneth J.Ruane, Alex C.Thorburn, Peter J.Cammarano, DavideHatfield, Jerry L.Rosenzweig, CynthiaAggarwal, Pramod K.Angulo, CarlosBasso, BrunoBertuzzi, PatrickBiernath, ChristianBrisson, NadineChallinor, Andrew J.Doltra, JordiGayler, SebastianGoldberg, RichieGrant, Robert F.Heng, LeeHooker, JoshHunt, Leslie A.Ingwersen, JoachimIzaurralde, Roberto CésarKersebaum, Kurt-ChristianMüller, ChristophKumar, Soora NareshNendel, ClaasO'Leary, Garry J.Olesen, J.E.Osborne, Tom M.Palosuo, TaruPriesack, EckartRipoche, DominiqueSemenov, Mikhail A.Shcherbak, IuriiSteduto, PasqualeStöckle, Claudio O.Stratonovitch, PierreStreck, ThiloSupit, IwanTao, FuluTravasso, MariaWaha, KatharinaWhite, Jeffrey W.Wolf, Joost[Multimodel ensembles of wheat growth: many models are better than one]Multimodel ensembles of wheat growth: many models are better than one
Asseng, SentholdEwert, FrankRosenzweig, CynthiaJones, James W.Hatfield, Jerry L.Ruane, Alex C.Boote, Kenneth J.Thorburn, Peter J.Rötter, Reimund P.Cammarano, DavideBrisson, NadineBasso, BrunoMarthe, PAggarwal, Pramod K.Angulo, CarlosBertuzzi, PatrickBiernath, ChristianChallinor, Andrew J.Doltra, JordiGayler, SebastianGoldberg, Richard A.Grant, RobertHeng, LeeHooker, JoshHunt, Leslie A.Ingwersen, JoachimIzaurralde, Roberto CésarKersebaum, Kurt-ChristianMüller, ChristophNaresh Kumar, SooraNendel, ClaasO'Leary, Garry J.Olesen, J.E.Osborne, Tom M.Palosuo, TaruPriesack, EckartRipoche, DominiqueSemenov, Mikhail A.Shcherbak, IuriiSteduto, PasqualeStöckle, Claudio O.Stratonovitch, PierreStreck, ThiloSupit, IwanTao, FuluTravasso, MariaWaha, KatharinaWallach, DanielWhite, Jeffrey W.Williams, JRWolf, J.[Uncertainty in simulating wheat yields under climate change]Uncertainty in simulating wheat yields under climate change

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